Design of High-Yield Defect-Tolerant Self-Assembled Nanoscale Memories

TitleDesign of High-Yield Defect-Tolerant Self-Assembled Nanoscale Memories
Publication TypeConference Paper
Year of Publication2007
AuthorsVenkatasubramanian, G, Boykin, PO, Figueiredo, RJ
Conference NameIEEE/ACM International Symp. on Nanoscale Architectures (NANOARCH)
Date Published09/2007