Publications and Presentations by the ACIS Lab

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E. Taylor, J. Han, and J. A. B. Fortes, “Towards the Accurate and Efficient Reliability Modeling of Nanoelectronic Circuits”, in 2006 IEEE Conference on Nanotechnology (IEEE-NANO 2006), 2006.
E. Taylor and J. A. B. Fortes, “Device Variability Impact on Logic Gate Failure Rates”, in Government Microcircuit Application and Critical Technology Conference (GOMACTech-07), 2007.