Combined Circuit and Microarchitecture Techniques for Effective Soft Error Robustness in SMT Processors

TitleCombined Circuit and Microarchitecture Techniques for Effective Soft Error Robustness in SMT Processors
Publication TypeConference Paper
Year of Publication2008
AuthorsFu, X, Li, T, Fortes, JAB
Conference NameInternational Conference on Dependable Systems and Networks (DSN)
Date Published06/2008