Faults, Error Bounds and Reliability of Nanoelectronic Circuits

TitleFaults, Error Bounds and Reliability of Nanoelectronic Circuits
Publication TypeConference Paper
Year of Publication2005
AuthorsHan, J, Taylor, E, Gao, J, Fortes, JAB
Conference Name IEEE 16th International Conference on Application-Specific Systems, Architectures and Processors (IEEE-ASAP 2005)
Date Published07/2005