Towards the Accurate and Efficient Reliability Modeling of Nanoelectronic Circuits

TitleTowards the Accurate and Efficient Reliability Modeling of Nanoelectronic Circuits
Publication TypeConference Paper
Year of Publication2006
AuthorsTaylor, E, Han, J, Fortes, JAB
Conference Name2006 IEEE Conference on Nanotechnology (IEEE-NANO 2006)
Date Published07/2006